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G. J. Hahn; Jr. W. D. Meeker Pitfalls and Practical Considerations in Product Life Analysis
General Electric Corporate Research and Development B003XCJ9RW PAPERBACK Good
B003XCJ9RW Paperback booklet, stapled binding, 24 pages, CRD / Corporate Research and Development, General Electric publishers, Technical Information Series 1, October 1980, Number 80CRD223. Book shows typical wear for moderately used book, covers have mild creasing near the binding. Usually ships with delivery confirmation. From the abstract: Important decisions are frequently made from the analysis of product life data. Sometimes, the data are obtained from a carefully planned experiment using the manufacturer's life test racks. More frequently, field test results are used, Various graphical and analytical methods such as fitting a Weibull distribution to the data, have been developed to allow analysts to obtain desired information. Simple models, such as the Weibull distribution, may, however, be inappropriate when (1) one is dealing with a population mixture, (2) there are multiple failure models, (3) some units are immune to failure from certain modes, or (4) there are startup failures. Use of a too simple model can lead to incorrect conclusions, especially when estimates beyond the data range are desired. This paper reviews the major purposes of product life analyses, shows how these differ from other common statistical analyses, and describes popular methods of analysis and some common pitfalls. These pitfalls are illustrated by detailed examples dealing with the analysis of human mortality data, electromechanical device data, and generated life data from two production periods. More general models for product life analysis and their use and various remedial measures are suggested. The emphasis is on recognizing the pitfalls and minimizing their potential adverse consequences in a practical situation, if possible.
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